Speaker
Andrei-Alexandru Aldini
("Horia Hulubei" National Institute for R&D in Physics and Nuclear Engineering; Faculty of Physics of the University of Bucharest)
Description
Quantitative mapping of depth profiles and stoichiometry in modern thin films demands analytical techniques capable of probing beyond the limits of standard surface imaging. Ion Beam Analysis (IBA) methods are uniquely suited for these conditions. Among them, Rutherford backscattering spectrometry (RBS) stands out as a premier, standard-less tool for heavy-element layer quantification on lighter substrates.
Author
Andrei-Alexandru Aldini
("Horia Hulubei" National Institute for R&D in Physics and Nuclear Engineering; Faculty of Physics of the University of Bucharest)